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* Optional internal pull-ups for SD/MMC pins in DTS * Selectable on‑chip LDO channel for SD/MMC power (can be disabled) * Added several sensor/driver modules to generic ESP32 device configurations so that they become part of the SDKs * SD card mount now prints card information for clearer diagnostics * Fix for bug DTS boolean parsing. Improved tests to catch these issues. * Expanded SDK integration test to include new modules and headers * Modularized packaging to generate per‑module build files and include driver assets
10 lines
184 B
YAML
10 lines
184 B
YAML
description: Generic test device binding
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compatible: "test,generic-device"
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properties:
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reg:
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type: int
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required: true
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int-prop:
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type: int
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string-prop:
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type: string |