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* Optional internal pull-ups for SD/MMC pins in DTS * Selectable on‑chip LDO channel for SD/MMC power (can be disabled) * Added several sensor/driver modules to generic ESP32 device configurations so that they become part of the SDKs * SD card mount now prints card information for clearer diagnostics * Fix for bug DTS boolean parsing. Improved tests to catch these issues. * Expanded SDK integration test to include new modules and headers * Modularized packaging to generate per‑module build files and include driver assets
16 lines
429 B
YAML
16 lines
429 B
YAML
description: Boolean test device binding
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compatible: "test,bool-device"
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properties:
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binding-default-true-setting-implied:
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type: boolean
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default: true
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binding-default-false-setting-implied:
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type: boolean
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default: false
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binding-default-false-setting-direct:
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type: boolean
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default: false
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binding-implied-true-setting-direct:
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type: boolean
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binding-implied-true-setting-implied:
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type: boolean |