Ken Van Hoeylandt 4170b86137
Various fixes and improvements (#515)
* Optional internal pull-ups for SD/MMC pins in DTS
  * Selectable on‑chip LDO channel for SD/MMC power (can be disabled)
  * Added several sensor/driver modules to generic ESP32 device configurations so that they become part of the SDKs
  * SD card mount now prints card information for clearer diagnostics
  * Fix for bug DTS boolean parsing. Improved tests to catch these issues.
  * Expanded SDK integration test to include new modules and headers
  * Modularized packaging to generate per‑module build files and include driver assets
2026-04-28 17:26:03 +02:00

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description: Generic test device binding
compatible: "test,generic-device"
properties:
reg:
type: int
required: true
int-prop:
type: int
string-prop:
type: string